期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023


题名作者出版年年卷期
Diagnosis of Analog and Digital Circuit Faults Using Exponential Deep Learning Neural NetworkRam, R. Saravana; Prabhaker, M. Lordwin Cecil20232023, vol.39, no.4
Structural and SCOAP Features Based Approach for Hardware Trojan Detection Using SHAP and Light Gradient Boosting ModelSharma, Richa; Sharma, G. K.; Pattanaik, Manisha; Prashant, V. S. S.20232023, vol.39, no.4
Test Technology Newsletter[Anonymous]20232023, vol.39, no.4
E 3 C Techniques for Protecting NAND Flash MemoriesLu, Shyue-Kung; Tsai, Zeng-Long20232023, vol.39, no.4
New Second-order Threshold Implementation of Sm4 Block CipherShao, Tianyi; Wei, Bohua; Ou, Yu; Wei, Yongzhuang; Wu, Xiaonian20232023, vol.39, no.4
Online Diagnosis and Self-Recovery of Faulty Cells in Daisy-Chained MEDA Biochips Using Functional Actuation PatternsZhang, Ling20232023, vol.39, no.4
Efficient Test and Characterization of Space Transmit-Receive Modules Using Scalable and Multipurpose Automated Test SystemChippalkatti, Vinod S.; Biradar, Rajashekhar C.; Shenoy, Venkatesh; Udayakumar, P.20232023, vol.39, no.4
EditorialAgrawal, Vishwani D.20232023, vol.39, no.4
Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate SystemsBalen, Tiago R.; Gonzalez, Carlos J.; Oliveira, Ingrid F. V.; da Rosa, Leomar S.; Soares, Rafael I.; Schvittz, Rafael B.; Added, Nemitala; Guazzelli, Marcilei A.; Medina, Nilberto H.; Butzen, Paulo F.; Macchione, Eduardo L. A.; Aguiar, Vitor A. P.20232023, vol.39, no.4
Threshold Analysis Using Probabilistic Xgboost Classifier for Hardware Trojan DetectionDhar, Tapobrata; Das, Ranit; Giri, Chandan; Roy, Surajit Kumar20232023, vol.39, no.4
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