KEYSIGHT AND ADI DEVELOP GMSL TEST METHODOLOGY


          

刊名：Electro Manufacturing
作者：anonymous
刊号：736B0295
ISSN：1041-052X
出版年：2024
年卷期：2024, vol.37, no.12
页码：5-6
总页数：2
分类号：TN10
语种：eng
文摘：Keysight Technologies, Inc. and Analog Devices, Inc. (ADI) have collaborated to create a comprehensive test solution for Gigabit Multimedia Serial Link (GMSL2) devices. This partnership focuses on developing Physical Medium Attachment (PMA) test methods and capabilities for the GMSL2 interface, enabling engineers, designers, and manufacturers to produce high-quality, high-performance products that enhance driving safety and support emerging Advanced Driver Assistance Systems (ADAS).



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