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DualBeam Instrument
     
  
  
刊名:
Tribology & Lubrication Technology
作者:
Thomas T. Astrene
刊号:
780B0005
ISSN:
1545-858X
出版年:
2019
年卷期:
2019, vol.75, no.9
页码:
62
总页数:
1
分类号:
TH117
语种:
eng
文摘:
Researchers now can apply a range of ion beam species within one focused ion beam (FIB) scanning electron microscopy instrument with the new Thermo Scientific Helios Hydra DualBeam system. This unique system was designed to deliver four different ions as the primary beam, including argon, nitrogen, oxygen and xenon, and quickly and easily switch between them in less than 10 minutes without sacrificing performance. This allows researchers and engineers to choose the ion species that provide the best results for their samples or do fundamental research on the interactions of different ions with matter. The Helios Hydra DualBeam instrument allows materials science researchers to discover and design new materials and analyze their properties and structure. With its oxygen ion beam, ideally suited for the milling of carbon-based materials such as graphite used in battery anodes, it could help researchers develop safer, lighter and more efficient energy storage devices. With switching times of 10 minutes or less, researchers also can apply all four beams to their sample within one session to determine which ion is best suited for their intended purpose. This flexibility expands the potential use cases of FIB in the exploration of ion-sample interactions.
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