Influence of a Trace Impurity on Tin Fixed Point Plateaus


     

文集名：Proceedings of SICE Annual Conference 2008
作者：Patchariya Petchpong（Advanced Manufacturing and Enterprise Engineering Group, Brunel University, Uxbridge, Middlesex UB8 3PH, UK, (E-mail: patchariya.petchpong@brunel.ac.uk)）
David I. Head
Joe Y. H. Au
会议名：2008 SICE Annual Conference (SICE 2008) - International Conference on Instrumentation, Control and Information Technology
会议日期：20-22 August, 2008
会议地点：Chofu, Tokyo, Japan
出版年：2008
页码：2706-2709
总页数：4
馆藏号：hyw01953
分类号：TH7-53/S678/(2008)+TP273
关键词：Tin fixed-point temperature；International Temperature Scale of 1990 (ITS-90)；Thermometry
参考中译：
语种：eng
文摘：The effect of trace cobalt impurity on the realisation of a high purity (99.9999%) tin fixed-point is presented. The aim is to improve the measurement of the temperature shift caused by low level impurity dopants, to test the interpolation of previous binary alloy systems [1] obtained using relatively high levels of impurities. The experiments and results, described below, revealed the shift of the melting and freezing curves of an initially "pure" tin cell by -0.71 mK/ppmw of cobalt, and confirmed the reproducibility of the temperature measurements in this fixed-point cell.



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